Workshop on Materials Characterization Techniques for XRD and XRF (ICMAB, 19th May 2014)
- Details
- Created on 04 February 2014
As part of RADDEL training programme activities, a workshop in materials characterization techniques will be held at ICMAB-CSIC on 19th May 2014:
http://congresses.icmab.es/mct2014/
The workshop includes the contribution of members of ICMAB-CSIC, ITJA-CSIC, ALBA, ICN2 and of industrial partners PARALAB and RIGAKU. The workshop will deal with X-ray diffraction (XRD) and X-ray Fluorescence (XRD), two available techniques for the characterization of materials.
Programme:
09:00 Registration
09:30 Presentation of the seminar
09:45 Prof. Jordi Rius (ICMAB-CSIC): "Brief introduction to lab XRD and description of the new software for structure solution and refinement of polycrystalline materials downloadable from ICMAB webpage"
10:10 Dr. Carlos Frontera (ICMAB-CSIC): "Structure refinement of thin films using lab equipment"
10:30 Dr. Raine Pulkkinen (Sales manager of RIGAKU): "New diffraction equipment and last generation of detectors"
11:15 Coffee break
11:30 Dr. Ignasi Queralt (ITJA-CSIC): "General introduction to X-ray Fluorescence spectroscopy (XRF). Its application to materials characterization"
12:15 Dr. Pol de Pape (Rigaku Europe): "Various types of XRF spectrometers"
13:00 Short communications
Prof. Elies Molins (Director of crystallography department, ICMAB-CSIC): "Single crystal diffraction and electron density studies"
Dr. Oriol Vallcorba (ALBA): "New structure solution possibilities of organic compounds from laboratory powder diffraction data"
Lcda. Anna Crespi (ICMAB-CSIC) "New XRD applications in transmission mode at ICMAB-CSIC"
The workshop is free to attend but registration is compulsory:
